RAMS 2017 Conference

Moorfield will be at the RAMS 2017 conference at the University of Exeter. Come along to meet our expert sales engineers and to see demos of our

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Engineered to defection

Researchers at the University of Cambridge and Nokia Research Centre have used Moorfield’s nanoETCH to carefully ‘damage’ single graphene sheets in order to minimise contact resistances in fabricated devices.

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