The technique, a form of defect engineering, is reported in Nature Communications as part of work on room-temperature pyroelectric bolometers.
Dr. Ugo Sassi, lead author of the work, said:
“Moorfield’s soft-etching technology was critical in allowing us create devices for accurate analysis of the underlying physical phenomena we set out to study”.
More information on the nanoETCH system and soft-etching technology can be found here.
